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Low-cost dc bist for analog circuits: a case study

dc.contributor.authorPetrashin, Pablo
dc.contributor.authorDualibe, Carlos
dc.contributor.authorToledo, Luis
dc.contributor.authorLancioni, Walter
dc.date.accessioned2021-09-16T18:36:12Z
dc.date.available2021-09-16T18:36:12Z
dc.date.issued2013
dc.identifier.urihttp://hdl.handle.net/11086/20347
dc.description.abstractThis paper presents a DC analog testing technique based on a simple voltage comparison of the highest sensitivity node, which is found by simulation. The technique is a structural, fault driven testing approach and can be applied to any analog circuit with very few extra added circuitry. A proof of concept has been implemented in a 65nm low-voltage transconductor, showing good fault coverage for both catastrophic and parametric faults.es
dc.format.mediumElectrónico y/o Digital
dc.language.isoenges
dc.publisherFacultad de Ciencias Exactas, Físicas y Naturaleses
dc.rightsAttribution-NonCommercial-ShareAlike 4.0 International*
dc.rights.urihttps://creativecommons.org/licenses/by-nc-sa/4.0/*
dc.subjectDC_TESTes
dc.subjectAnaloges
dc.subjectTestinges
dc.subjectElectrónicaes
dc.titleLow-cost dc bist for analog circuits: a case studyes
dc.typeconferenceObjectes
dc.description.filFil: Petrashin, Pablo. Universidad Nacional de Córdoba. Facultad de Ciencias Exactas Físicas y Naturales. Carrera de Ingeniería Electrónica; Argentina.es
dc.description.filFil: Dualibe, Carlos. Universidad Católica de Córdoba. Facultad de Ingeniería. Laboratorio de Microelectrónica; Argentina.es
dc.description.filFil: Lancioni, Walter. Universidad Cátólica de Córdoba. Facultad de Ingeniería; Argentina.es
dc.description.filFil: Toledo, Luis. Universidad Católica de Córdoba; Argentina.es
dc.description.fieldOtras Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.conference.cityCórdoba
dc.conference.countryArgentina
dc.conference.editorialLATW
dc.conference.eventLatin American Test Workshop
dc.conference.eventcityCórdoba
dc.conference.eventcountryArgentina
dc.conference.eventdate2013-4
dc.conference.institutionUNC
dc.conference.journalAnales del Congreso
dc.conference.publicationLibro
dc.conference.workArtículo Completo
dc.conference.typeCongreso


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Except where otherwise noted, this item's license is described as Attribution-NonCommercial-ShareAlike 4.0 International