Now showing items 1-2 of 2

    • Experimental determination of multiple ionization cross sections in Si by electron impact 

      Pérez, Pablo Daniel; Sepúlveda, Andrés; Castellano, Gustavo; Trincavelli, Jorge (2015)
      The thin sample method is often used to experimentally determine ionization cross sections, specially when focusing on the low overvoltage region. The simplicity of the formalism involved in this method is very appealing, ...
    • Structure of the Ru, Ag and Te L X-ray emission spectra 

      Rodríguez Cabello, Tabatha Pamela; Sepúlveda Peñaloza, Andrés Humberto; Carreras, Alejo Cristian; Castellano, Gustavo Eugenio; Trincavelli, Jorge Carlos (2016)
      The emission of X-rays in atomic transitions from L-shell vacancy states of Ru, Ag and Te induced by electron incidence was studied. To this end, L X-ray spectra were measured with a wavelength dispersive spectrometer, and ...