Browsing Artículos by Author "Sepúlveda, Andrés"
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Experimental determination of multiple ionization cross sections in Si by electron impact
Pérez, Pablo Daniel; Sepúlveda, Andrés; Castellano, Gustavo; Trincavelli, Jorge (2015)The thin sample method is often used to experimentally determine ionization cross sections, specially when focusing on the low overvoltage region. The simplicity of the formalism involved in this method is very appealing, ...