Browsing by Author "Seguí Osorio, Silvina Inda María"
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Monte Carlo simulation of characteristic secondary fluorescence in electron probe microanalysis of homogeneous samples using the splitting technique
Petaccia Trobatto, Mauricio Germán; Seguí Osorio, Silvina Inda María; Castellano, Gustavo Eugenio (2015)Electron probe microanalysis (EPMA) is based on the comparison of characteristic intensities induced by monoenergetic electrons. When the electron beam ionizes inner atomic shells and these ionizations cause the emission ...